ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,102, issued on Nov. 3, was assigned to Dust Co. Inc. (Raleigh, N.C.). "Settled dust measurement device using capacitance" was invented by Ro... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,103, issued on Nov. 3, was assigned to Infineon Technologies AG (Neubiberg, Germany). "Apparatus and method for measuring a magnetic angle" ... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,104, issued on Nov. 3, was assigned to FORWARD ELECTRONICS Co. LTD. (Taipei City, Taiwan). "Encoder with light emitting diode" was invented ... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,105, issued on Nov. 3, was assigned to Festo SE & Co. KG (Esslingen, Germany). "Method and device for determining a piston or wheel position... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,106, issued on Nov. 3, was assigned to SEIKO EPSON Corp. (Japan). "Laser interferometer" was invented by Jun Kitagawa (Matsumoto, Japan) and... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,107, issued on Nov. 3, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Semiconductor measurement device" was invented... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,108, issued on Nov. 3, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Semiconductor measurement apparatus" was inven... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,109, issued on Nov. 3, was assigned to Munro Design & Technologies LLC (Ontario, N.Y.). "Reflective co-axial interferometer systems and meth... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,110, issued on Nov. 3, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Semiconductor measuring device using beam disp... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,111, issued on Nov. 3, was assigned to Onto Innovation Inc. (Wilmington, Mass.). "Metrology device with wavelength-frequency multiplexing" w... और पढ़ें